emission spectrometry

Spectral Emittance Measurement of C/C Composite

C/C复合材料光谱发射率测量研究

The Measurement of Spectral Emissivity Based on Neural Network and DSP Technology;

基于神经网络和DSP技术的光谱发射率测量

Study on Measurement of Spectral Emissivity of Materials Based on Fourier Infrared Spectrometer;

基于傅立叶红外光谱仪的材料光谱发射率测量技术的研究

Measuring Spectral Emissivity of Natural Objects with FTIR

基于快速傅立叶红外光谱仪的自然地物光谱发射率测量

Field measurements of meadow surface emissivity spectra at the Xilinhaote grassland of China

锡林浩特草原陆表热红外发射率光谱野外测量

Measuring method for normal spectral emittance of infrared heater

GB/T7287.10-1987红外辐射加热器光谱法向发射率测量方法

The Measurement for the Photo-detector's Absolute Spectral Responsivity Based on the Cryogenic Radiometer

基于低温辐射计的探测器绝对光谱响应率测量

Determination of total rare-earth elements in steel by OES

火花源发射光谱法测定钢中稀土总量

Research and Manufacture of Emissivity Test System Based on FT/IR;

基于傅立叶光谱仪发射率测试系统的研制

New Spectrometric Instrument for X-Ray Luminescence Materials Observation

一种新的X-射线发光光谱测量装置的建立

This paper presents the experimental method to measure the high reflectivity of optical mirror by cavity ring-down spectroscopy.

根据光腔衰荡光谱技术原理，建立了测量镜片反射率的实验装置。

Selection of Spectroscopic Buffers in Spectrochemical Analysis of Rare Earth (Ⅱ) Measurement of Arc Temperature

稀土元素发射光谱分析中光谱缓冲剂的选择(Ⅱ) 电弧温度的测量

The experimental resu lts show that the above-mentioned method can solve the true temperature and spectral emissivity measurement of most engineering materials.

实验结果表明，该方法可以解决绝大多数工程材料的目标真温及光谱发射率的测量问题。

Zirconium oxide--Determination of hafnium oxide content--Emission spectrophotometric method

GB/T2590.8-1981氧化锆中氧化铪量的测定(发射光谱法)

Determination of Trace Amounts of Copper by Flow Injection Vapor Generation AAS

流动注射蒸气发生原子吸收光谱测定痕量铜

DETERMINATION OF TRACE Rb AND Cs By GFAES

石墨炉原子发射光谱法测定痕量铷和铯

Measurement and Analysis of the Transient Emission Spectra of Epoxypropane in the Process of DDT;

环氧丙烷DDT过程瞬态发射光谱的测量与分析

Investigation of Multi-Wavelength Effect During the Measurement of UV-Enhanced Film's Emission Spectrum

紫外增强薄膜发射光谱测量中的倍波现象分析